5 * SPDX-License-Identifier: BSD-4-Clause
7 * Copyright (c) 2002 Jason L. Wright (jason@thought.net)
10 * Redistribution and use in source and binary forms, with or without
11 * modification, are permitted provided that the following conditions
13 * 1. Redistributions of source code must retain the above copyright
14 * notice, this list of conditions and the following disclaimer.
15 * 2. Redistributions in binary form must reproduce the above copyright
16 * notice, this list of conditions and the following disclaimer in the
17 * documentation and/or other materials provided with the distribution.
18 * 3. All advertising materials mentioning features or use of this software
19 * must display the following acknowledgement:
20 * This product includes software developed by Jason L. Wright
21 * 4. The name of the author may not be used to endorse or promote products
22 * derived from this software without specific prior written permission.
24 * THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR
25 * IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED
26 * WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
27 * DISCLAIMED. IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT,
28 * INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES
29 * (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
30 * SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION)
31 * HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
32 * STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN
33 * ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
34 * POSSIBILITY OF SUCH DAMAGE.
38 /* Some of the tests depend on these values */
39 #define RNDTEST_NBYTES 2500
40 #define RNDTEST_NBITS (8 * RNDTEST_NBYTES)
42 struct rndtest_state {
43 device_t rs_parent; /* associated device */
44 u_int8_t *rs_end, *rs_begin, *rs_current;
46 int rs_collect; /* collect and test data */
47 int rs_discard; /* discard/accept random data */
48 u_int8_t rs_buf[RNDTEST_NBYTES];
51 struct rndtest_stats {
52 u_int32_t rst_discard; /* number of bytes discarded */
53 u_int32_t rst_tests; /* number of test runs */
54 u_int32_t rst_monobit; /* monobit test failures */
55 u_int32_t rst_runs; /* 0/1 runs failures */
56 u_int32_t rst_longruns; /* longruns failures */
57 u_int32_t rst_chi; /* chi^2 failures */
60 extern struct rndtest_state *rndtest_attach(device_t dev);
61 extern void rndtest_detach(struct rndtest_state *);
62 extern void rndtest_harvest(struct rndtest_state *arg, void * buf, u_int len);